Performance Analysis for Clock and Data Recovery Circuits under Process Variation

In this research, a clock and data recovery circuit is laid out by TSMC 180 nm technology. The performance variation caused by process variation is investigated by HSPICE simulation, and compared with the theoretical analysis results derived through the mathematical model of the clock and data recovery circuit. The results demonstrate that our theoretical model matches well with the real simulations. Both theoretical and simulation results also indicate that process variations in the low pass filter have significant impact on performance parameters such as damping ratio, natural frequency, and lock time of the clock and data recovery circuit.