DocumentCode
1913935
Title
Computer as a Tool for Nanocluster NVM Cells Diagnostics
Author
Turchanikov, V. ; Nazarov, A. ; Lysenko, V. ; Winkler, O. ; Spangenberg, B. ; Kurz, H.
Author_Institution
Lashkaryov Inst. of Semicond. Phys. NAS Ukraine, Kyiv
Volume
1
fYear
2005
fDate
21-24 Nov. 2005
Firstpage
358
Lastpage
360
Abstract
Development of nanocluster based non volatile memory (NVM) cells instead of the commonly used floating gate structures requires a new approach to the reliability testing of nanocluster NVM structures. The algorithm of this testing is rather complex and cannot be implemented without computer based diagnostic systems. The paper presented deals with the testing algorithms of the nanocluster NVM cells and, also, with software and hardware needed for algorithm realization
Keywords
electronic engineering computing; flash memories; integrated circuit reliability; integrated circuit testing; nanoelectronics; computer based diagnostic system; nanocluster NVM cells diagnostics; nonvolatile memory; reliability testing; Data acquisition; Electric breakdown; Nanostructures; Nonvolatile memory; Software algorithms; Software measurement; Software testing; System testing; Time measurement; Velocity measurement; nanoclusters; nanodots; reliability; testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer as a Tool, 2005. EUROCON 2005.The International Conference on
Conference_Location
Belgrade
Print_ISBN
1-4244-0049-X
Type
conf
DOI
10.1109/EURCON.2005.1629935
Filename
1629935
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