Title :
Models for simulation of diode (and IGBT) switchings which include the effect of the depletion layer
Author :
Kvien, Oddgeir ; Undeland, Tore M. ; Rogne, Jae-duk
Author_Institution :
Fac. of Electr. Eng. & Comput. Sci., Norwegian Inst. of Technol., Trondheim, Norway
Abstract :
A diode model which can be used in a complete circuit with a general-purpose circuit simulation program (KREAN) is developed. The diode is the basis in an IGBT (insulated-gate bipolar transistor) model. This diode model shows a reverse recovery current that is independent both on di/dt and on the voltage at turn off. A dynamic forward voltage drop is also included. This is achieved by including the following mechanisms: carrier injection which modulates the conductivity, carrier lifetime, and a voltage-dependent depletion layer that includes the mechanism of isolating carriers at turn-off with low voltage and giving a tail current at high voltage. Combining two diode models and a MOSFET characteristic in one model, an IGBT model that gets both bipolar and MOSFET currents is obtained, which the authors take as proof of the accuracy of the theory behind the diode model. Laboratory measurements are included to verify the simulations of the IGBTs
Keywords :
circuit analysis computing; digital simulation; insulated gate bipolar transistors; semiconductor device models; semiconductor diodes; switching; IGBT; KREAN; MOSFET characteristic; carrier injection; carrier lifetime; carriers isolation; circuit simulation program; conductivity modulation; diode switching; dynamic forward voltage drop; high voltage; insulated-gate bipolar transistor; low voltage; reverse recovery current; tail current; turn-off; voltage-dependent depletion layer; Charge carrier processes; Circuit simulation; Computational modeling; Computer science; Conductivity; Insulated gate bipolar transistors; MOSFETs; P-n junctions; Semiconductor diodes; Voltage;
Conference_Titel :
Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-1462-X
DOI :
10.1109/IAS.1993.299048