Title :
Thorough evaluation of Hot-Carrier Induced Degradation in Deep Submicron Thin-film UNIBOND and SIMOX N-MOSFETs
Author :
Renn, S.H. ; Jomaah, J. ; Balestra, F. ; Raynaud, C.
Author_Institution :
LPCS/ENSERG/INPG, Grenoble, France
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
