Title :
Application to microbiological fermentation fault diagnosis for relevance vector machine
Author :
Sun, Zonghai ; Sun, Youxian
Author_Institution :
Nat. Lab. of Ind. Control Technol., Zhejiang Univ., Hangzhou, China
Abstract :
Microbiological fermentation is a kind of complicated batch process that is severely nonlinear and time variant. There are many process parameters needed to monitor and control in order to make the microbiological fermentation process successful. So it is important to fault diagnose for microbiological fermentation sensor. In this paper we provide a new method for fault diagnosis of microbiological fermentation, i.e. two relevance vector machines which are viewed as observer and classifier respectively. The observer is applied to estimate release rate of carbon dioxide to gain residual sequence. The classifier is applied to the residuals. The results of experiments demonstrate that this method can effectively diagnose instrument faults.
Keywords :
batch processing (industrial); fault diagnosis; fermentation; process control; process monitoring; fault diagnosis; microbiological fermentation; relevance vector machine; residual sequence; Carbon dioxide; Condition monitoring; Delay; Fault diagnosis; Fungi; Instruments; Pressure control; Sun; Support vector machines; Temperature control;
Conference_Titel :
Control Applications, 2003. CCA 2003. Proceedings of 2003 IEEE Conference on
Print_ISBN :
0-7803-7729-X
DOI :
10.1109/CCA.2003.1223217