• DocumentCode
    1914060
  • Title

    Extraction of the apparent electron lifetime in the base of Si/Si(1-x)Ge(x) Heterojunction Bipolar Transistors

  • Author

    Assous, M. ; Mouis, M.

  • Author_Institution
    France Telecom, Meylan, France
  • fYear
    1998
  • fDate
    8-10 Sept. 1998
  • Firstpage
    256
  • Lastpage
    259
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1998. Proceeding of the 28th European
  • Conference_Location
    Bordeaux, France
  • Print_ISBN
    2-86332-234-6
  • Type

    conf

  • Filename
    1503537