Towards a unified test process: from UML to end-of-line functional test

Author

Baldini, Andrea ; Benso, Alfredo ; Prinetto, Paolo ; Mo, Sergio ; Taddei, Andrea

Author_Institution

Dipt. di Automatica e Informatica, Politecnico di Torino, Italy

fYear

2001

fDate

2001

Firstpage

600

Lastpage

608

Abstract

In this paper, we propose the use of a UML methodology to go from user requirements and specifications to end of production testing of complex embedded systems. We consider behavioral, structural and physical levels building a comprehensive and modular model. The process contains the definition of a set of properties being created and then updated in each phase, and heavily relies on message passing and elaborating facilities to increase both abstraction and descriptive power. Result of the process is test pattern generation using custom ATE commands. We also present and discuss an underdevelopment case study of a significantly complex automotive application

Keywords

automatic test equipment; automatic test pattern generation; automotive electronics; embedded systems; logic testing; message passing; production testing; specification languages; UML methodology; abstraction; automotive application; behavioral levels; complex embedded systems; comprehensive modular model; custom ATE commands; descriptive power; end-of-line functional test; message passing; physical levels; production testing; structural levels; test pattern generation; unified modeling language; unified test process; user requirements; user specifications; Automatic testing; Automotive applications; Buildings; Electronic equipment testing; Embedded software; Embedded system; Production systems; Research and development; System testing; Unified modeling language;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2001. Proceedings. International

Conference_Location

Baltimore, MD

ISSN

1089-3539

Print_ISBN

0-7803-7169-0

Type

conf

DOI

10.1109/TEST.2001.966679

Filename

966679