Title :
Dynamic tests in complex systems [automotive electronics]
Author :
Tappe, Robert ; Ehrhardt, Dietmar
Author_Institution :
AUDI AG Ingolstadt, Germany
Abstract :
Changes in system structures in the way toward distributed networks allow brand-new possibilities. In the automotive world new functions can be offered to the customer. Together with a distributed system rises the problem to identify a fault in the system because a faulty system behavior can not be associated directly to a fault component. New ways for an intelligent and effective fault detection must be found to solve the problem. The following work presents a solution for dynamic fault detection
Keywords :
automatic testing; automotive electronics; distributed processing; fault diagnosis; integrated circuit testing; SPICE model; analog amplifier; automotive world; complex systems; distributed networks; distributed system; dynamic fault detection; dynamic tests; fault identification; intelligent fault detection; Batteries; Circuit faults; Circuit testing; Electrical fault detection; Engines; Fault detection; Fault diagnosis; Gears; System testing; Vehicle dynamics;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966680
