DocumentCode
1914230
Title
Dynamic tests in complex systems [automotive electronics]
Author
Tappe, Robert ; Ehrhardt, Dietmar
Author_Institution
AUDI AG Ingolstadt, Germany
fYear
2001
fDate
2001
Firstpage
609
Lastpage
614
Abstract
Changes in system structures in the way toward distributed networks allow brand-new possibilities. In the automotive world new functions can be offered to the customer. Together with a distributed system rises the problem to identify a fault in the system because a faulty system behavior can not be associated directly to a fault component. New ways for an intelligent and effective fault detection must be found to solve the problem. The following work presents a solution for dynamic fault detection
Keywords
automatic testing; automotive electronics; distributed processing; fault diagnosis; integrated circuit testing; SPICE model; analog amplifier; automotive world; complex systems; distributed networks; distributed system; dynamic fault detection; dynamic tests; fault identification; intelligent fault detection; Batteries; Circuit faults; Circuit testing; Electrical fault detection; Engines; Fault detection; Fault diagnosis; Gears; System testing; Vehicle dynamics;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966680
Filename
966680
Link To Document