DocumentCode

1914259

Title

Data Retention in SOI-DRAM with Trench Capacitor Cell

Author

Hanafi, Hussein I. ; Kanarsky, T. ; Schmitz, Stefan ; Hathorn, Kevin

Author_Institution

IBM Corporation, Yorktown Heights, NY, United States

fYear

1998

fDate

8-10 Sept. 1998

Firstpage

276

Lastpage

279

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location

Bordeaux, France

Print_ISBN

2-86332-234-6

Type

conf

Filename

1503542