Title :
Electron transport in CeOx-based resistive switching devices
Author :
Miranda, E. ; Suñé, J. ; Kano, Shingo ; Dou, Chunyan ; Kakushima, K. ; Iwai, Hisato
Author_Institution :
Dept. d´´Eng. Electron., Univ. Autonoma de Barcelona, Barcelona, Spain
Abstract :
The electron transport in electroformed W/CeOx/SiO2/NiSi2 capacitors grown onto a p+-type Si substrate is investigated within the framework of the Landauer theory for mesoscopic systems. It is shown that the devices exhibit bipolar resistive switching with conductance levels in the low resistance state (LRS) of the order of integer and half integer values of the quantum conductance unit G0 = 2e2/h. This is consistent with the so-called nonlinear conduction regime in quantum point contacts. A simple model for the LRS I-V characteristics which accounts for the available right- and left-going conduction modes allowed by the constriction´s size and the voltage drop distribution along the filamentary path is presented.
Keywords :
MIM devices; cerium compounds; electroforming; nickel compounds; semiconductor switches; silicon compounds; tungsten compounds; LRS I-V characteristics; Landauer theory; W-CeOx-SiO2-NiSi2; bipolar resistive switching; electroformed capacitor; electron transport; left-going conduction mode; low resistance state; mesoscopic system; metal-insulator-metal; nonlinear conduction regime; p+-type silicon substrate; quantum conductance unit; quantum point contact; resistive switching device; right-going conduction mode; voltage drop distribution; Electric potential; Electrodes; Metals; Silicon; Simulation; Substrates; Switches; MIM; dielectric breakdown; resistive switching;
Conference_Titel :
Devices, Circuits and Systems (ICCDCS), 2012 8th International Caribbean Conference on
Conference_Location :
Playa del Carmen
Print_ISBN :
978-1-4577-1116-9
Electronic_ISBN :
978-1-4577-1115-2
DOI :
10.1109/ICCDCS.2012.6188928