Title :
FedEx - a fast bridging fault extractor
Author :
Stanojevic, Zoran ; Walker, D.M.H.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
Test pattern generation and diagnosis algorithms that target realistic bridging faults must be provided with a realistic fault list. In this work we describe FedEx, a bridging fault extractor that extracts a circuit from the mask layout, identifies the two-node bridges that can occur, their locations, layers, and relative probability of occurrence. Our experimental results show that FedEx is memory efficient and fast
Keywords :
automatic test pattern generation; fault diagnosis; integrated circuit testing; FedEx; automatic test pattern generation; bridging fault extractor; diagnosis algorithm; integrated circuit; Bridge circuits; Circuit faults; Circuit testing; Computer science; Distributed computing; Fault diagnosis; Integrated circuit manufacture; Manufacturing; Software tools; Wires;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966690
