Power supply transient signal integration circuit

Author

Patel, Chintan ; Muradali, Fidel ; Plusquellic, Jim

Author_Institution

Dept. of CSEE, Maryland Univ., Baltimore, MD, USA

fYear

2001

fDate

2001

Firstpage

704

Lastpage

712

Abstract

We discuss a circuit which measures and analyses power supply transients as defined in the test technique, Transient Signal Analysis (TSA). This circuit can replace the benchtop instrumentation and offline signal processing software used in previous work. The circuit accepts voltage transients as analog inputs from the Device-Under-Test (DUT), performs integration and outputs an analog value to the tester. The tester compares the output value to a predetermined threshold as a means of determining the pass/fail status of the DUT. This circuit is designed to simplify the hardware requirements of TSA

Keywords

circuit simulation; digital integrated circuits; integrated circuit testing; integrating circuits; transient analysis; DUT; Spice simulations; analog inputs; analog value; digital integrated circuit testing; hardware requirements simplification; pass/fail status; power supply transient signal integration circuit; power supply transients measurement; predetermined threshold; test technique; transient signal analysis; voltage transients; Circuit testing; Instruments; Integrated circuit measurements; Performance evaluation; Power measurement; Power supplies; Signal analysis; Signal processing; Transient analysis; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2001. Proceedings. International

Conference_Location

Baltimore, MD

ISSN

1089-3539

Print_ISBN

0-7803-7169-0

Type

conf

DOI

10.1109/TEST.2001.966691

Filename

966691