Title :
Power supply transient signal integration circuit
Author :
Patel, Chintan ; Muradali, Fidel ; Plusquellic, Jim
Author_Institution :
Dept. of CSEE, Maryland Univ., Baltimore, MD, USA
Abstract :
We discuss a circuit which measures and analyses power supply transients as defined in the test technique, Transient Signal Analysis (TSA). This circuit can replace the benchtop instrumentation and offline signal processing software used in previous work. The circuit accepts voltage transients as analog inputs from the Device-Under-Test (DUT), performs integration and outputs an analog value to the tester. The tester compares the output value to a predetermined threshold as a means of determining the pass/fail status of the DUT. This circuit is designed to simplify the hardware requirements of TSA
Keywords :
circuit simulation; digital integrated circuits; integrated circuit testing; integrating circuits; transient analysis; DUT; Spice simulations; analog inputs; analog value; digital integrated circuit testing; hardware requirements simplification; pass/fail status; power supply transient signal integration circuit; power supply transients measurement; predetermined threshold; test technique; transient signal analysis; voltage transients; Circuit testing; Instruments; Integrated circuit measurements; Performance evaluation; Power measurement; Power supplies; Signal analysis; Signal processing; Transient analysis; Voltage;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966691
