• DocumentCode
    1914571
  • Title

    Applying the radiated emission to the specific emitter identification

  • Author

    Dudczyk, Janusz ; Matuszewski, Jan ; Wnuk, Marian

  • Author_Institution
    Mil. Unit, Skierniewice, Poland
  • Volume
    2
  • fYear
    2004
  • fDate
    17-19 May 2004
  • Firstpage
    431
  • Abstract
    During the last years we have observed fast development of the electronic devices and electronic warfare systems (EW). One of the most principal functions of the ESM/ELINT system is gathering basic information from the entire electromagnetic spectrum and its analysis. Simultaneously, utilization of some tools of artificial intelligence (AI) during the process of emitter identification is very important too. A significant role is played by Measurement and Signature Intelligence (MASINT) based on nonintentional emission (calls-radiated emission). This emission is a source of knowledge about an analysed emitter due to its incidental "chemical", "spectral" traces and noncommunication emitter\´s characteristics. The process of Specific emitter Identification (SEI) based on extraction of distinctive radiated emission features is presented by the authors. Specially important is utilization of a database (DB) in the process of identifying a detectable radar emission.
  • Keywords
    TEM cells; artificial intelligence; electromagnetic compatibility; electronic warfare; open area test sites; radar interference; ESM-ELINT system; EW; MASINT; SEI; artificial intelligence; detectable radar emission; electromagnetic spectrum; electronic warfare system; measurement-signature intelligence; specific emitter identification; Chemical analysis; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic propagation; Electromagnetic radiation; Open area test sites; Qualifications; TEM cells; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Radar and Wireless Communications, 2004. MIKON-2004. 15th International Conference on
  • Print_ISBN
    83-906662-7-8
  • Type

    conf

  • DOI
    10.1109/MIKON.2004.1357058
  • Filename
    1357058