Title :
The 3D modeling and SI/PI co-sim analysis for mixed-referenced high speed GDDR5
Author :
Sun, Yu H. ; Qi, Xiaoning ; Ramirez, Antonio Zenteno
Author_Institution :
RA1-226, SC12-501, Intel, Hillsboro, OR, USA
Abstract :
In this paper, a methodology for combined simulation (co-sim) of power and signal to ensure a proper signal-to-power-ground ratio in vertical connections is presented. Capturing the vertical return current, power-to-signal, and signal-to-signal crosstalk simultaneously and accurately requires the modeling of the entire memory channel using 3D tools. Combined simulations allow a highly sensitive analysis in the design of vertical return path such as plated-through-hole (PTH) and ball grid array (BGA) connections. Proposed co-sim methodology is demonstrated with GDDR5 memory channel simulations based on two validation boards with a throughput-computing, high-performance processor. As a result of the analysis, design guidelines and recommendations were defined.
Keywords :
ball grid arrays; circuit simulation; crosstalk; integrated memory circuits; solid modelling; 3D modeling; 3D tools; BGA connection; GDDR5 memory channel simulations; PTH connection; SI/PI co-sim analysis; ball grid array connection; co-sim methodology; combined simulation; design guidelines; high-performance processor; mixed-referenced high speed GDDR5; plated-through-hole; power-to-signal crosstalk; sensitive analysis; signal-to-power-ground ratio; signal-to-signal crosstalk; throughput-computing; validation boards; vertical connections; vertical return current; vertical return path; Atmospheric modeling; Computational modeling; Crosstalk; Impedance; Solid modeling; Three dimensional displays; Throughput; BGA; PTH; co-simulation; crosstalk; memory channel simulation;
Conference_Titel :
Devices, Circuits and Systems (ICCDCS), 2012 8th International Caribbean Conference on
Conference_Location :
Playa del Carmen
Print_ISBN :
978-1-4577-1116-9
Electronic_ISBN :
978-1-4577-1115-2
DOI :
10.1109/ICCDCS.2012.6188934