Title :
Acceleration of IC verification process using advanced flexible modular measurement systems and software architectures
Author :
Pirker-Fruhauf, A. ; Gallent, Wolfgang ; Kunze, Matthias ; Pelz, Georg
Author_Institution :
KAI-Kompetenzzentrum Automobil- und Ind.-Elektron. GmbH, Villach
Abstract :
Test engineers use automated test systems in applications ranging from design validation to end-of-line production test with the aim of ensuring the quality and reliability of a product that reaches the end customer. As complexity of integrated circuits is exponentially growing and consequently the verification process time, the use of automated test systems to perform simple pass/fail tests or product characterization measurements have quickly become an even more important part of the product development process. This paper gives advise to develop test systems that lower cost, increase test throughput, and can scale with future requirements.
Keywords :
automatic test software; electronic engineering computing; integrated circuit design; integrated circuit testing; measurement systems; product development; production testing; IC verification process acceleration; automated test systems; end-of-line production test; flexible modular measurement systems; integrated circuits; product development; software architectures; Acceleration; Accelerometers; Automatic testing; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Reliability engineering; Software architecture; Software measurement; System testing; PXI; PXI switching; XML; XSLT;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2008.4547345