DocumentCode :
1914925
Title :
AMLETO: a multi-language environment for functional test generation
Author :
Fin, Alessandro ; Fummi, Franco ; Pravadelli, Graziano
Author_Institution :
Dipt. di Informatica, Verona Univ., Italy
fYear :
2001
fDate :
2001
Firstpage :
821
Lastpage :
829
Abstract :
More and more people are starting to use the SystemC description language to model and simulate new designs. This is due mainly to the simplicity and power of the language. The number of models written in SystemC currently available is still very limited and testing SystemC descriptions is still an open issue, since the language is new and researchers are looking for efficient error models and coverage metrics. This paper presents AMLETO, a multi-language environment developed to efficiently test embedded systems and IP-Cores. Using IIR, an HDL language independent representation, it supplies: fast translation from VHDL to SystemC of design descriptions and viceversa, generation and setup of customized TPGs for the design under test and generation of erroneous models capable of simulating the presence of design errors
Keywords :
automatic test pattern generation; automatic test software; embedded systems; fault simulation; hardware description languages; programming environments; AMLETO; HDL language independent representation; IIR; IP-cores; SystemC description language; VHDL designs; customized TPGs; design error simulation; design under test; embedded systems; functional test generation; multi-language environment; Computational modeling; Delay; Electronic design automation and methodology; Embedded system; Error correction; Hardware design languages; History; Power system modeling; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966704
Filename :
966704
Link To Document :
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