DocumentCode :
1914955
Title :
Associative memory for geon-based object identification
Author :
Leonard, S. ; Lepage, Richard ; Redarce, Tanneguy
Author_Institution :
Lab. d´´Imagerie, Ecole de Technol. Superieure, Montreal, Que., Canada
Volume :
5
fYear :
1999
fDate :
1999
Firstpage :
3494
Abstract :
Online inspection for defects in manufactured parts is a challenging problem and a crucial issue for any production process. Precise and extended CAD data describe the manufactured part under inspection and can be stored in a database in order to perform comparisons between the measured observed part (with a 3D laser camera, for instance) and its CAD description. The problem is very slow access time to find the right CAD model, because of the huge amount of data necessary to represent even a very simple manufactured piece. We propose a fast access to the database based on a vision-derived representation of the part, much less precise than the CAD representation but which offers a very low storage requirement. CAD representations of the models are converted off-line into a vision-based representation used to train a neural network. Volumetric projected components (geons) and their interrelationship are extracted from the digitized image of the piece under inspection and input to a neural network whose outputs point to the most probable models in the large database. Corresponding CAD data is then available for the inspection module
Keywords :
CAD; automatic optical inspection; content-addressable storage; image recognition; object recognition; online operation; visual databases; 3D laser camera; CAD data; CAD description; CAD representations; associative memory; digitized image; fast database access; geon-based object identification; neural network training; online defect inspection; vision-based representation; vision-derived representation; volumetric projected components; Associative memory; Cameras; Computer aided manufacturing; Databases; Inspection; Laser modes; Manufacturing processes; Neural networks; Performance evaluation; Production;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1999. IJCNN '99. International Joint Conference on
Conference_Location :
Washington, DC
ISSN :
1098-7576
Print_ISBN :
0-7803-5529-6
Type :
conf
DOI :
10.1109/IJCNN.1999.836229
Filename :
836229
Link To Document :
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