A high-resolution jitter measurement technique using ADC sampling

Author

Cherubal, Sasikumar ; Chatterjee, Abhijit

Author_Institution

ARDEXT Technol., Atlanta, GA, USA

fYear

2001

fDate

2001

Firstpage

838

Lastpage

847

Abstract

In this paper, we propose a new technique for jitter measurement that can be implemented using commercially available, off-the-shelf components. The technique implements a high-resolution, high-speed, phase detector using a high-speed Analog-to-Digital Converter (ADC). The technique is shown to have high resolution and low test time compared to currently available techniques. Experimental results to demonstrate the effectiveness of the technique are presented

Keywords

analogue-digital conversion; digital integrated circuits; high-speed integrated circuits; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; phase detectors; production testing; signal sampling; timing jitter; ADC sampling; digital ICs; digital circuits; high-resolution high-speed phase detector; high-resolution jitter measurement technique; high-speed ADC; low test time; mixed-signal ICs; production testing; Circuit testing; Clocks; Current measurement; Detectors; Measurement techniques; Noise measurement; Phase detection; Sampling methods; Time measurement; Timing jitter;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2001. Proceedings. International

Conference_Location

Baltimore, MD

ISSN

1089-3539

Print_ISBN

0-7803-7169-0

Type

conf

DOI

10.1109/TEST.2001.966706

Filename

966706