• DocumentCode
    1914997
  • Title

    An approach to consistent jitter modeling for various jitter aspects and measurement methods

  • Author

    Shimanouchi, Masashi

  • Author_Institution
    Schlumberger Semicond. Solutions, San Jose, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    848
  • Lastpage
    857
  • Abstract
    Timing jitter, period jitter, long term jitter, jitter spectrum, SSB phase noise, etc. are terms that have been used to describe various aspects of jitter phenomena. While several jitter measurement techniques have been proposed with associated jitter models and modeling techniques, the relationship among various jitter aspects, and therefore, the relationship among various jitter measurement techniques is not very obvious. This paper analytically clarifies their relationship, and reviews several jitter measurement techniques based on the results of our analytical studies
  • Keywords
    integrated circuit measurement; integrated circuit modelling; integrated circuit noise; phase noise; timing jitter; SSB phase noise; equivalent noise voltage model; jitter aspects; jitter measurement techniques; jitter modeling; jitter spectrum; long term jitter; period jitter; phase noise model; timing jitter; Amplitude modulation; Attenuation measurement; Clocks; Measurement techniques; Noise measurement; Oscilloscopes; Phase measurement; Phase noise; Timing jitter; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966707
  • Filename
    966707