DocumentCode
1914997
Title
An approach to consistent jitter modeling for various jitter aspects and measurement methods
Author
Shimanouchi, Masashi
Author_Institution
Schlumberger Semicond. Solutions, San Jose, CA, USA
fYear
2001
fDate
2001
Firstpage
848
Lastpage
857
Abstract
Timing jitter, period jitter, long term jitter, jitter spectrum, SSB phase noise, etc. are terms that have been used to describe various aspects of jitter phenomena. While several jitter measurement techniques have been proposed with associated jitter models and modeling techniques, the relationship among various jitter aspects, and therefore, the relationship among various jitter measurement techniques is not very obvious. This paper analytically clarifies their relationship, and reviews several jitter measurement techniques based on the results of our analytical studies
Keywords
integrated circuit measurement; integrated circuit modelling; integrated circuit noise; phase noise; timing jitter; SSB phase noise; equivalent noise voltage model; jitter aspects; jitter measurement techniques; jitter modeling; jitter spectrum; long term jitter; period jitter; phase noise model; timing jitter; Amplitude modulation; Attenuation measurement; Clocks; Measurement techniques; Noise measurement; Oscilloscopes; Phase measurement; Phase noise; Timing jitter; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966707
Filename
966707
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