DocumentCode :
1915084
Title :
Prioritizing Tests for Software Fault Localization
Author :
Gonzalez-Sanchez, Alberto ; Piel, Eric ; Gross, Hans-Gerhard ; Van Gemund, Arjan J C
Author_Institution :
Software Technol. Dept., Delft Univ. of Technol., Delft, Netherlands
fYear :
2010
fDate :
14-15 July 2010
Firstpage :
42
Lastpage :
51
Abstract :
Test prioritization techniques select test cases that maximize the confidence on the correctness of the system when the resources for quality assurance (QA) are limited. In the event of a test failing, the fault at the root of the failure has to be localized, adding an extra debugging cost that has to be taken into account as well. However, test suites that are prioritized for failure detection can reduce the amount of useful information for fault localization. This deteriorates the quality of the diagnosis provided, making the subsequent debugging phase more expensive, and defeating the purpose of the test cost minimization. In this paper we introduce a new test case prioritization approach that maximizes the improvement of the diagnostic information per test. Our approach minimizes the loss of diagnostic quality in the prioritized test suite. When considering QA cost as the combination of testing cost and debugging cost, on the Siemens set, the results of our test case prioritization approach show up to a 53% reduction of the overall QA cost, compared with the next best technique.
Keywords :
fault location; program debugging; program testing; software quality; diagnosis quality; failure detection; quality assurance; software fault localization; test case prioritization approach; test cost minimization; test prioritization technique; Software; debugging; diagnosis; test prioritization; testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Software (QSIC), 2010 10th International Conference on
Conference_Location :
Zhangjiajie
ISSN :
1550-6002
Print_ISBN :
978-1-4244-8078-4
Electronic_ISBN :
1550-6002
Type :
conf
DOI :
10.1109/QSIC.2010.28
Filename :
5562943
Link To Document :
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