DocumentCode :
1915143
Title :
Metrological Characterisation of a Time of Flight CMOS Range Image Sensor
Author :
Leonardi, F. ; Covi, D. ; Petri, D.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY
fYear :
2008
fDate :
12-15 May 2008
Firstpage :
1946
Lastpage :
1951
Abstract :
This paper presents a metrological characterisation of an indirect time of flight (ITOF) CMOS range image sensor. A number of experiments were performed to measure the actual performance of the system under test and to highlight its strength and weak points, with a focus on which limits are related to the design and which are intrinsic in the operating principle. The proposed system allows repeatable and accurate measurements but pixel-level calibration is needed to achieve high accuracy over the whole frame. The averaging process required to improve the signal-to-noise ratio of the acquired signal, reduces the potential use in real-time operations, especially at distances greater than 1.5 m or with low-reflective targets.
Keywords :
CMOS image sensors; averaging process; flight CMOS range image sensor; indirect time of flight; metrological characterisation; pixel-level calibration; signal-to-noise ratio; Algorithm design and analysis; CMOS image sensors; CMOS process; Computer science; Distance measurement; Image sensors; Layout; Pulse measurements; Sensor phenomena and characterization; Time measurement; CMOS 3D range image sensor; ITOF; distance measurement; uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
ISSN :
1091-5281
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2008.4547366
Filename :
4547366
Link To Document :
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