Title :
Test and mesurement equipment for design of digital systems and devices
Author_Institution :
Tektronix Int., Inc., Moscow
Abstract :
This article gives an overview of test and measurement solutions for design and debug of electronic devices, and the challenges that the engineers face in their day-to-day work.
Keywords :
circuit testing; digital systems; digital system design; electronic devices; equipment measurement; Design engineering; Digital systems; Electronic equipment testing; Helium; System testing;
Conference_Titel :
Actual Problems of Electron Devices Engineering, 2008. APEDE '08. International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4244-2121-3
Electronic_ISBN :
978-1-4244-2122-0
DOI :
10.1109/APEDE.2008.4720203
