DocumentCode
1915153
Title
Test and mesurement equipment for design of digital systems and devices
Author
Matvienko, A.B.
Author_Institution
Tektronix Int., Inc., Moscow
fYear
2008
fDate
24-25 Sept. 2008
Firstpage
523
Lastpage
528
Abstract
This article gives an overview of test and measurement solutions for design and debug of electronic devices, and the challenges that the engineers face in their day-to-day work.
Keywords
circuit testing; digital systems; digital system design; electronic devices; equipment measurement; Design engineering; Digital systems; Electronic equipment testing; Helium; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering, 2008. APEDE '08. International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4244-2121-3
Electronic_ISBN
978-1-4244-2122-0
Type
conf
DOI
10.1109/APEDE.2008.4720203
Filename
4720203
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