Title :
Optimal production test times through adaptive test programming
Author :
Benner, Scott ; Boroffice, Oluseyi
Author_Institution :
QUALCOMM Inc., San Diego, CA, USA
Abstract :
Describes a process by which optimal production test times are obtained using an adaptive test programming technique. Besides obtaining optimal test times, other benefits described include higher inherent quality and reduced engineering overhead
Keywords :
automatic test equipment; integrated circuit testing; production testing; quality control; statistical analysis; ATE; SOC; adaptive test programming technique; engineering overhead; inherent quality; optimal test times; production test times; test parameters; Automatic testing; Circuit testing; Cost function; Integrated circuit testing; Performance evaluation; Production; Statistical analysis; System testing; System-on-a-chip; Test equipment;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966714
