• DocumentCode
    1915176
  • Title

    Optimal production test times through adaptive test programming

  • Author

    Benner, Scott ; Boroffice, Oluseyi

  • Author_Institution
    QUALCOMM Inc., San Diego, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    908
  • Lastpage
    915
  • Abstract
    Describes a process by which optimal production test times are obtained using an adaptive test programming technique. Besides obtaining optimal test times, other benefits described include higher inherent quality and reduced engineering overhead
  • Keywords
    automatic test equipment; integrated circuit testing; production testing; quality control; statistical analysis; ATE; SOC; adaptive test programming technique; engineering overhead; inherent quality; optimal test times; production test times; test parameters; Automatic testing; Circuit testing; Cost function; Integrated circuit testing; Performance evaluation; Production; Statistical analysis; System testing; System-on-a-chip; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966714
  • Filename
    966714
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1915176