DocumentCode :
1915196
Title :
IS-FPGA : a new symmetric FPGA architecture with implicit scan
Author :
Renovell, M. ; Faure, P. ; Portal, J.M. ; Figueras, J. ; Zorian, Y.
Author_Institution :
LIRMM-UM2, Montpellier, France
fYear :
2001
fDate :
2001
Firstpage :
924
Lastpage :
931
Abstract :
Proposes a new and original FPGA architecture with testability facilities. It is first demonstrated that classical FPGA architectures do not allow one to efficiently implement sequential circuits with a scan chain. It is consequently proposed to modify the architecture of classical FPGAs in order to create an implicit-scan chain into the FPGA itself called implicit scan FPGA (IS-FPGA). Using this new FPGA architecture, any sequential circuit implemented into the FPGA is ´implicitly scanned´. An original and optimal implementation of the proposed architecture is given with minimum area overhead and absolutely no delay impact. Additionally the technique is transparent for the user as well as for the FPGA mapping tools. Finally, it is demonstrated that the implicit-scan concept allows ´over-scan´ of sequential circuits resulting in highly testable circuits
Keywords :
delays; design for testability; field programmable gate arrays; integrated circuit testing; logic testing; sequential circuits; IS-FPGA; area overhead; delay impact; highly testable circuits; implicit SCAN; mapping tools; sequential circuits; symmetric FPGA architecture; testability facilities; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Logic circuits; Logic programming; Logic testing; Manufacturing; Multiplexing; Programmable logic arrays; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966716
Filename :
966716
Link To Document :
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