مرکز منطقه ای اطلاع رساني علوم و فناوري - Device Reliability and Repeatability of a High Performance Si/SiGe HBT BiCMOS Technology

DocumentCode :

1915300

Title :

Device Reliability and Repeatability of a High Performance Si/SiGe HBT BiCMOS Technology

Author :

Ahlgren, D.C. ; Hueckel, G. ; Freeman, G. ; Walter, K. ; Groves, R. ; Ting, T.H. ; Vayshenker, A. ; Hostetter, E.

Author_Institution :

IBM Microelectronics Division, Hopewell Junction, NY, United States

fYear :

1998

fDate :

8-10 Sept. 1998

Firstpage :

452

Lastpage :

455

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 1998. Proceeding of the 28th European

Conference_Location :

Bordeaux, France

Print_ISBN :

2-86332-234-6

Type :

conf

Filename :

1503586

Link To Document :