• DocumentCode
    1915349
  • Title

    Testability implications in low-cost integrated radio transceivers: a Bluetooth case study

  • Author

    Ozev, Sule ; Gaard, C. ; Orailoglu, Alex

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    965
  • Lastpage
    974
  • Abstract
    As the use of wireless communications in daily life increases, attaining low-cost solutions becomes increasingly important due to shrinking profit margins. Cost optimization that solely targets at minimization of the cost of system architecture may result in suboptimal, highly untestable, solutions. Test design and design for testability need to be incorporated into the system design flow to achieve viable solutions. This paper presents an analysis of test requirements, implications and test cost for low-cost Bluetooth systems. Testability problems are identified and possible solutions along with avenues to reduce the test cost by utilizing lower-cost testers are discussed
  • Keywords
    design for testability; frequency hop communication; phase noise; spread spectrum communication; telecommunication equipment testing; telecontrol; transceivers; DFT; PLL phase noise; RF testing; RMS phase noise; VCO phase noise; design for testability; low-cost Bluetooth systems; low-cost integrated radio transceivers; receiver architectures; specification-based tests; synthesizer specifications; test cost reduction; test design; testability problems; transceiver architectures; transmit architectures; wireless communications; Bit error rate; Bluetooth; Circuit testing; Computer aided software engineering; Cost function; Design for testability; Hardware; Radio frequency; Radio transceivers; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966721
  • Filename
    966721