Title :
Memory built-in self-repair using redundant words
Author :
Schober, Volker ; Paul, Steffen ; Picot, Olivier
Author_Institution :
Infineon Technol. AG, Munich, Germany
Abstract :
A word oriented memory Built-In Self-Repair (BISR) methodology is described without modifying the memory module. Faulty addresses and its data are stored in the redundancy logic immediately after its detection during test. Fuse boxes can be connected via scan registers to the redundancy logic
Keywords :
automatic test pattern generation; built-in self test; integrated circuit testing; integrated memory circuits; redundancy; faulty addresses; fuse boxes; memory BIST redundancy; memory built-in self-repair; memory testing; redundancy logic; redundant words; scan based ATPG; scan registers; word oriented memory BISR; Automatic testing; Built-in self-test; Fault detection; Fault diagnosis; Fuses; Logic testing; Random access memory; Redundancy; Regions; Registers;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966724
