DocumentCode
1915429
Title
Memory built-in self-repair using redundant words
Author
Schober, Volker ; Paul, Steffen ; Picot, Olivier
Author_Institution
Infineon Technol. AG, Munich, Germany
fYear
2001
fDate
2001
Firstpage
995
Lastpage
1001
Abstract
A word oriented memory Built-In Self-Repair (BISR) methodology is described without modifying the memory module. Faulty addresses and its data are stored in the redundancy logic immediately after its detection during test. Fuse boxes can be connected via scan registers to the redundancy logic
Keywords
automatic test pattern generation; built-in self test; integrated circuit testing; integrated memory circuits; redundancy; faulty addresses; fuse boxes; memory BIST redundancy; memory built-in self-repair; memory testing; redundancy logic; redundant words; scan based ATPG; scan registers; word oriented memory BISR; Automatic testing; Built-in self-test; Fault detection; Fault diagnosis; Fuses; Logic testing; Random access memory; Redundancy; Regions; Registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966724
Filename
966724
Link To Document