DocumentCode :
1915444
Title :
An effort-minimized logic BIST implementation method
Author :
Gu, Xinli ; Chung, Sung Soo ; Tsang, Frank ; Tofte, Jan A. ; Rahmanian, Hamid
Author_Institution :
Cisco Syst. Inc., San Jose, CA, USA
fYear :
2001
fDate :
2001
Firstpage :
1002
Lastpage :
1010
Abstract :
This paper presents LBIST (Logic Built-In Self Test) design practice at Cisco Systems. It focuses on the LBIST design tasks that could affect design schedules and efforts. These are design timing closure and signature mismatch debugging. Our timing closure technique guarantees timing closure for LBIST insertion without any iteration between synthesis and LBIST insertion. In addition, it guarantees that only one iteration between static timing analysis and LBIST insertion is required to close all timing violations. The signature mismatch debugging technique effectively identifies the causes by indicating the pattern, the scan flip-flop and its operation mode, where the mismatch happens. These techniques save design efforts and the product-to-market time. We have integrated this method into an ASIC design flow. The results of using this flow in a large telecommunication design are described
Keywords :
application specific integrated circuits; automatic test pattern generation; built-in self test; circuit CAD; design for testability; high level synthesis; integrated circuit design; integrated circuit testing; logic testing; timing; ASIC design flow; ATPG; Cisco Systems; LBIST design practice; LBIST insertion; design schedules; design timing closure; effort-minimized logic BIST; large telecommunication design; logic built-in self test; scan flip-flop; signature mismatch debugging; static timing analysis; test pattern; timing violations; Automatic testing; Built-in self-test; Clocks; Debugging; Frequency; Logic design; Logic testing; System testing; Test pattern generators; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
ISSN :
1089-3539
Print_ISBN :
0-7803-7169-0
Type :
conf
DOI :
10.1109/TEST.2001.966725
Filename :
966725
Link To Document :
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