DocumentCode
1915472
Title
Reliability modelling with respect to circuit applications
Author
Verweij, J.F. ; Mouthaan, A.J.
Author_Institution
MESA Res. Inst., Univ. of Twente, Enschede, Netherlands
fYear
1993
fDate
13-16 Sept. 1993
Firstpage
719
Lastpage
725
Abstract
For a designer it is important to incorporate reliability aspects in his circuit simulator. This is done via the construction and incorporation of models for degradation mechanisms. In this paper we review benefits, necessary conditions and relevant parameters. Moreover, some examples are given of achievements in this field.
Keywords
circuit reliability; circuit simulation; network synthesis; circuit applications; circuit simulator; degradation mechanisms; reliability aspects; reliability modelling; Analytical models; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Degradation; Dielectrics; Resistors; Temperature; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European
Conference_Location
Grenoble
Print_ISBN
2863321358
Type
conf
Filename
5435594
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