Title :
Geometry Scaling of the Substrate Loss of RF MOSFETs
Author :
Tiemeijer, L.F. ; Klaassen, D.B.M.
Author_Institution :
Philips Research Laboratories, Eindhoven, Netherlands
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
