Title :
Use of BIST in Sun FireTM servers
Author :
Braden, John ; Lin, Qing ; Smith, Brian
Author_Institution :
Sun MicroSysterms Inc., Mountain View, CA, USA
Abstract :
The latest UltraSPARCTM III generation of servers from Sun Microsystems makes extensive use of BIST and other DFT techniques to help improve test coverage and reduce test time during power-on self test. This paper is a case study which examines a number of different BIST techniques used in the Sun FireTM Midframe servers, and shows how they were combined to improve diagnosis of faults and overall system availability. Specific DFT techniques which are discussed include ASIC-based internal and external memory BIST, ASIC logic BIST, microprocessor-controlled interconnect test using IEEE 1149.1 boundary scan, and at-speed interconnect BIST tests across system buses
Keywords :
application specific integrated circuits; automatic test pattern generation; boundary scan testing; built-in self test; design for testability; fault diagnosis; integrated circuit testing; logic testing; network servers; ASIC logic BIST; ASIC-based external memory BIST; ASIC-based internal memory BIST; BIST techniques; DFT techniques; IEEE 1149.1 boundary scan; Sun Fire Midframe servers; Sun Fire server family; Sun Microsystems; UltraSPARC III generation; at-speed interconnect BIST tests; fault diagnosis; microprocessor-controlled interconnect test; power-on self test; system availability; system buses; test coverage improvement; test time reduction; Application specific integrated circuits; Automatic testing; Built-in self-test; Fault diagnosis; Fires; Logic testing; Power generation; Sun; System buses; System testing;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966727
