Title :
Low-Frequency Noise in SiGe P-Channel MOSFETs designed for 0.13 um Technology
Author :
Okhonin, S. ; Georgescu, B. ; Py, M.A. ; Fischer, H. ; Risch, L.
Author_Institution :
Swiss Federal Institute of Technology, Lausanne, Switzerland
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
