Interconnect Characterization Flow for Minimal-Segment Model Selection

We present a new method to find minimal-complexity interconnect models that obey a certain specified accuracy in relation to the true waveform. The method can be described as an interconnect characterization flow that defines simple rules for finding the minimal number of segments and required segment type, RC or RLC, by regarding interconnect resistance, driver source resistance, interconnect characteristic impedance and load capacitance. To show the application of the method, segment selection rules are derived for a case with a waveform discrepancy constraint of 5%