Title :
MOSFET Fluctuation Limits on Gigascale Integration (GSI)
Author :
Tang, Xinghai ; De, Vivek K. ; Meindl, James D.
Author_Institution :
Georgia Institute of Technology, Atlanta, United States
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
