Title :
Correlation Analysis of the Statistical Electrical Parameter Fluctuations in 50 nm MOS-Transistors
Author :
Horstmann, J.T. ; Hilleringmann, U. ; Goser, K.
Author_Institution :
University of Dortmund, Germany
Conference_Titel :
Solid-State Device Research Conference, 1998. Proceeding of the 28th European
Conference_Location :
Bordeaux, France
Print_ISBN :
2-86332-234-6
