Title :
Pin electronics IC for high speed differential devices
Author :
Oshima, Atsushi ; Poniatowski, John ; Nomura, Toshihiro
Author_Institution :
Schlumberger Semicond. Solutions, Kanagawa, Japan
Abstract :
The pin electronics IC (PEIC) was developed for testing high speed, differential devices up to 3.2 Gbps. Each PEIC has a fully differential driver and comparator with a selector. The calibration method for differential comparator is also discussed
Keywords :
calibration; comparators (circuits); driver circuits; integrated circuit testing; peripheral interfaces; test equipment; timing; 3.2 Gbit/s; PEIC; calibration method; comparator; differential comparator; differential devices; fully differential driver; high speed differential device testing; pin electronics IC; selector; testing; Circuit testing; Crosstalk; Driver circuits; Electronic equipment testing; High speed integrated circuits; Low voltage; Pins; Switches; System testing; Timing;
Conference_Titel :
Test Conference, 2001. Proceedings. International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-7169-0
DOI :
10.1109/TEST.2001.966739
