DocumentCode
1915912
Title
When zero picoseconds edge placement accuracy is not enough
Author
Cheng, John
Author_Institution
Teradyne Inc., Boston, MA, USA
fYear
2001
fDate
2001
Firstpage
1134
Lastpage
1142
Abstract
In the last ten years, test equipment suppliers have driven improvements in edge placement accuracy taking it from ±225ps to sub-100ps through a combination of architectural improvements and new calibration technology. However with the adoption of high speed source synchronous buses such as HyperTransport and RapidIO on high performance devices, it is no longer sufficient to just look at the tester EPA component in the overall timing budget. Although test system accuracy is still very important, error terms from the DUT must also be considered. The proposed methodology of device strobed comparators addresses both test system and device error terms
Keywords
automatic test equipment; calibration; comparators (circuits); synchronisation; system buses; 225 to 100 ps; HyperTransport; RapidIO; burst time optimization; calibration; device strobed comparators; edge placement accuracy; errors; high speed source synchronous buses; sweeping window; test equipment; timing budget; Application software; Bandwidth; Clocks; Fabrics; Microprocessors; Multimedia databases; Switches; System testing; Test equipment; Transmitters;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2001. Proceedings. International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-7169-0
Type
conf
DOI
10.1109/TEST.2001.966740
Filename
966740
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