• DocumentCode
    1915912
  • Title

    When zero picoseconds edge placement accuracy is not enough

  • Author

    Cheng, John

  • Author_Institution
    Teradyne Inc., Boston, MA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1134
  • Lastpage
    1142
  • Abstract
    In the last ten years, test equipment suppliers have driven improvements in edge placement accuracy taking it from ±225ps to sub-100ps through a combination of architectural improvements and new calibration technology. However with the adoption of high speed source synchronous buses such as HyperTransport and RapidIO on high performance devices, it is no longer sufficient to just look at the tester EPA component in the overall timing budget. Although test system accuracy is still very important, error terms from the DUT must also be considered. The proposed methodology of device strobed comparators addresses both test system and device error terms
  • Keywords
    automatic test equipment; calibration; comparators (circuits); synchronisation; system buses; 225 to 100 ps; HyperTransport; RapidIO; burst time optimization; calibration; device strobed comparators; edge placement accuracy; errors; high speed source synchronous buses; sweeping window; test equipment; timing budget; Application software; Bandwidth; Clocks; Fabrics; Microprocessors; Multimedia databases; Switches; System testing; Test equipment; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2001. Proceedings. International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7169-0
  • Type

    conf

  • DOI
    10.1109/TEST.2001.966740
  • Filename
    966740