Title :
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Abstract :
The following topics are dealt with:wafer scale; yield; dependable design; testing techniques; fault-tolerance in arrays; mixed signal circuits; defect analysis; self-checking and fail-safe circuits; and fault-tolerant techniques
Keywords :
VLSI; fault diagnosis; fault tolerance; integrated circuit design; integrated circuit reliability; integrated circuit testing; integrated circuit yield; mixed analogue-digital integrated circuits; wafer-scale integration; defect analysis; design; fail-safe circuits; fault-tolerant techniques; mixed signal circuits; self-checking; testing techniques; wafer scale; yield;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7695-1203-8
DOI :
10.1109/DFTVS.2001.966745
