Title :
Advanced fault-tolerance techniques for a color digital camera-on-a-chip
Author :
Koren, Israel ; Chapman, Glenn ; Koren, Zahava
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
Color digital imagers contain red, green and blue subpixels within each color pixel. Defects that develop either at fabrication time or due to environmentally induced errors over time can cause a single color subpixel (e.g., R) to fail, while leaving the remaining colors intact. This paper investigates seven software correction algorithms that interpolate the color of a pixel based on its nearest neighbors. Using several measurements of color error, all seven methods were investigated for a large number of digital images. Interpolations using only information from the single failed color (e.g., R) in the neighbors gave the poorest results. Those using all color measurements and a quadratic interpolation formula, combined with the remaining subpixel colors (e.g., G and B) produced significantly better results. A formula developed using the CIE color coordinates of tristimulus values (X, Y, Z) yielded the best results
Keywords :
CMOS image sensors; cameras; colour photography; fault tolerance; interpolation; CIE color coordinates; color digital camera-on-a-chip; color measurements; environmentally induced errors; fabrication time; fault-tolerance techniques; quadratic interpolation formula; software correction algorithms; subpixels; tristimulus values; Chromium; Digital cameras; Fault tolerance; Fault tolerant systems; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7695-1203-8
DOI :
10.1109/DFTVS.2001.966746