• DocumentCode
    1916337
  • Title

    Combined profiling: A methodology to capture varied program behavior across multiple inputs

  • Author

    Berube, Paul ; Amaral, José Nelson

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Alberta, Edmonton, AB, Canada
  • fYear
    2012
  • fDate
    1-3 April 2012
  • Firstpage
    210
  • Lastpage
    220
  • Abstract
    This paper introduces combined profiling (CP): a new practical methodology to produce statistically sound combined profiles from multiple runs of a program. Combining profiles is often necessary to properly characterize the behavior of a program to support Feedback-Directed Optimization (FDO). CP models program behaviors over multiple runs by estimating their empirical distributions, providing the inferential power of probability distributions to code transformations. These distributions are build from traditional single-run point profiles; no new profiling infrastructure is required. The small fixed size of this data representation keeps profile sizes, and the computational costs of profile queries, independent of the number of profiles combined. However, when using even a single program run, a CP maintains the information available in the point profile, allowing CP to be used as a drop-in replacement for existing techniques. The quality of the information generated by the CP methodology is evaluated in LLVM using SPEC CPU 2006 benchmarks.
  • Keywords
    data structures; optimisation; program compilers; program diagnostics; statistical distributions; LLVM; SPEC CPU 2006 benchmarks; code transformations; combined profiling; computational costs; data representation; empirical distributions; feedback-directed optimization; multiple runs; probability distributions; profile queries; single-run point profiles; varied program behavior; Histograms; Joints; Measurement; Monitoring; Optimization; Probability distribution; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Performance Analysis of Systems and Software (ISPASS), 2012 IEEE International Symposium on
  • Conference_Location
    New Brunswick, NJ
  • Print_ISBN
    978-1-4673-1143-4
  • Electronic_ISBN
    978-1-4673-1145-8
  • Type

    conf

  • DOI
    10.1109/ISPASS.2012.6189227
  • Filename
    6189227