• DocumentCode
    1916496
  • Title

    Reduction of Simultaneous Switching Noise in Digital Circuits

  • Author

    Backenius, E. ; Vesterbacka, M.

  • Author_Institution
    Dept. of Electr. Eng., Linkoping Univ.
  • fYear
    2006
  • fDate
    Nov. 2006
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    In this paper the authors present results from measurements on a test chip used to evaluate our method for reduction of substrate noise that originates from the clock in digital circuits. The authors use long rise and fall times of the clock signal and a D flip-flop that operates well with this clock. With this approach, smaller clock buffers can be used, which results in smaller current peaks on the power supply lines and therefore less switching noise. The measured substrate noise on the test chip was reduced by 20% and up to 54%. With optimized clock buffers this method has a potential of an even larger noise reduction
  • Keywords
    CMOS integrated circuits; buffer circuits; clocks; flip-flops; integrated circuit noise; integrated circuit testing; D flip-flop; clock buffers; clock signal; digital circuits; integrated circuit testing; noise reduction; power supply lines; simultaneous switching noise; Circuit noise; Circuit testing; Clocks; Digital circuits; Flip-flops; Noise measurement; Noise reduction; Power supplies; Semiconductor device measurement; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Norchip Conference, 2006. 24th
  • Conference_Location
    Linkoping
  • Print_ISBN
    1-4244-0772-9
  • Type

    conf

  • DOI
    10.1109/NORCHP.2006.329207
  • Filename
    4126978