Title :
Proceedings of the 23rd European Solid State Device Research Conference
Abstract :
The following topics are dealt with: semiconductor devices; noise; thin film transistors; reliability; bipolar devices; CMOS technology; lasers; heteroFETs; EPROM; CMOS modeling; HBT; sensors; silicon on insulators; optoelectronics; and low voltage-low power IC.
Keywords :
CMOS integrated circuits; EPROM; field effect transistors; heterojunction bipolar transistors; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; integrated optoelectronics; lasers; low-power electronics; semiconductor device models; semiconductor device noise; semiconductor device reliability; sensors; silicon-on-insulator; thin film transistors; CMOS modeling; CMOS technology; EPROM; HBT; bipolar device; heteroFET; laser; low voltage-low power IC; optoelectronic; semiconductor device; sensor; silicon on insulator; thin film transistor;
Conference_Titel :
Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European
Conference_Location :
Grenoble
