DocumentCode
1916638
Title
Nondestructive measurement for multilayer inhomogeneous material based on multiresolution analysis
Author
Zhu, Jianxin
Author_Institution
Dept. of Appl. Math., Zhejiang Univ., China
fYear
1999
fDate
1999
Firstpage
118
Lastpage
122
Abstract
In this paper, a new and effective method based on multiresolution analysis (wavelet analysis) is proposed. It is used to nondestructively reconstruct the depth distribution of optical-absorption coefficient in multilayer inhomogeneous material with the photothermal signals which are related to the surface temperature of a sample. Numerical simulations and experimental data show that this method is feasible and the performance of the approach is better
Keywords
absorption coefficients; multilayers; nondestructive testing; photothermal effects; wavelet transforms; depth distribution; diode; multilayer inhomogeneous material; multiresolution analysis; nondestructive measurement; numerical simulations; optical absorption; optical-absorption coefficient; photothermal signals; surface temperature; wavelet analysis; Absorption; Light emitting diodes; Multiresolution analysis; Nitrogen; Nonhomogeneous media; Optical materials; Optical modulation; Optical surface waves; Solids; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1999. Proceedings. 1999 IEEE Hong Kong
Conference_Location
Shatin
Print_ISBN
0-7803-5648-9
Type
conf
DOI
10.1109/HKEDM.1999.836422
Filename
836422
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