DocumentCode
1916650
Title
A testing instrument for dynamic contact resistance
Author
Wenhua, Li ; Zhigang, Li
Author_Institution
Electr. Apparatus Inst., Hebei Univ. of Technol., Tianjin, China
fYear
1999
fDate
1999
Firstpage
124
Lastpage
127
Abstract
A mathematical model of the contact resistance of electrical apparatus contacts and its dynamic changing law are discussed, and a new testing instrument for the dynamic contact process of low-capacitance contacts (mainly relay contacts) is introduced
Keywords
automatic test equipment; contact resistance; electrical contacts; relays; reliability; dynamic changing law; dynamic contact resistance; electrical apparatus contact; low-capacitance contact; mathematical model; periodic automatic test; relay contact; testing instrument; Bridge circuits; Capacitance; Contact resistance; Electric resistance; Electric variables measurement; Electrical resistance measurement; Instruments; Relays; Surface resistance; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1999. Proceedings. 1999 IEEE Hong Kong
Conference_Location
Shatin
Print_ISBN
0-7803-5648-9
Type
conf
DOI
10.1109/HKEDM.1999.836423
Filename
836423
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