Title :
Testing Xilinx XC4000 configurable logic blocks with carry logic-modules
Author :
Sun, Xiaoling ; Xu, Jian ; Trouborst, Pieter
Author_Institution :
Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
This paper presents a novel built-in self-test (BIST) scheme for configurable logic blocks (CLBs) of Xilinx XC4000 field programmable gate arrays (FPGAs). The test of the dedicated carry logic module (CLM) within a CLB is included for the first time. A minimum of eight CLB test configurations is given. A centralized BIST architecture supports the single stuck-at fault test of the CLM and the whole CLB. The scheme is also capable of locating any faulty CLBs with the maximum diagnostic resolution, two adjacent CLBs
Keywords :
built-in self test; carry logic; fault diagnosis; field programmable gate arrays; integrated circuit testing; logic testing; BIST scheme; Xilinx XC4000 FPGA; built-in self-test scheme; centralized BIST architecture; configurable logic blocks; dedicated carry logic module; field programmable gate arrays; single stuck-at fault test; test configurations; Built-in self-test; Circuit faults; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Logic arrays; Logic design; Logic functions; Logic testing; Table lookup;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7695-1203-8
DOI :
10.1109/DFTVS.2001.966774
