Title :
Compact fluorescent lamp adapter measurement with integrated system of virtual instrumentation
Author_Institution :
OSRAM Sylvania Inc., Danvers, MA, USA
Abstract :
A method of integrating compact fluorescent lamp (CFL) adapter measurements using virtual instrument software is presented. The program, CFL TEST VI, for CFL adapter testing is written in the graphical programming language LabVIEW. Important parameters such as input current, input wattage, lamp voltage, lamp current, and lamp wattage are acquired through an IEEE-488 interface. Data are analyzed and presented on a computer display as virtual meters and chart recorders. Lamp stabilization is determined by statistical analysis of the incoming data. The input and lamp current waveforms are transferred from the digital oscilloscope to the computer. The CFL TEST VI calculates the THD (total harmonic distortion) of the input line current, the RMS lamp current, the lamp current crest factor, etc. The VI then plots the input current waveform, lamp current waveform, and computed FFT (fast Fourier transform) waveform of the input current
Keywords :
computerised instrumentation; electric current measurement; fast Fourier transforms; fluorescent lamps; harmonics; power measurement; software packages; stability; statistical analysis; voltage measurement; CFL TEST VI; IEEE-488 interface; LabVIEW; RMS; adapter measurement; chart recorders; compact fluorescent lamp; crest factor; digital oscilloscope; fast Fourier transform; graphical programming language; input current; input wattage; lamp current; lamp voltage; lamp wattage; stability; statistical analysis; total harmonic distortion; virtual instrument software; virtual meters; waveform; Computer displays; Computer languages; Data analysis; Fluorescent lamps; Instruments; Oscilloscopes; Software measurement; Statistical analysis; Testing; Voltage;
Conference_Titel :
Industry Applications Society Annual Meeting, 1993., Conference Record of the 1993 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-1462-X
DOI :
10.1109/IAS.1993.299177
