Title :
Reliability enhancement of analog-to-digital converters (ADCs)
Author :
Singh, Mandeep ; Koren, Israel
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Abstract :
The reliability of systems used in space, avionic and biomedical applications is highly critical. Such systems consist of an analog front-end to collect data, an ADC to convert the collected data to digital form and a digital unit to process it. The reliability of these systems is affected by the ability of its constituent blocks to tolerate faults. Therefore, it is necessary to increase the reliability of ADCs to ensure a highly reliable critical system. This paper illustrates the steps involved in the reliability enhancement of ADCs by first proposing a methodology for fault sensitivity analysis and then illustrating redesign techniques to improve the reliability of the highly sensitive(to faults) blocks
Keywords :
analogue-digital conversion; fault diagnosis; fault tolerance; integrated circuit reliability; redundancy; sensitivity analysis; ADC reliability; fault sensitivity analysis; fault tolerance; folding/interpolating ADCs; highly reliable critical system; pattern detection; redesign techniques; redundancy; reliability enhancement; transistor sizing; Analog-digital conversion; Fault tolerant systems; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7695-1203-8
DOI :
10.1109/DFTVS.2001.966788
