• DocumentCode
    1917429
  • Title

    Analyses on spectrum characteristics of Si/Ag/Si nano-composite films based on surface plasmons

  • Author

    Peng, Yufeng ; Wu, Dingyun

  • Author_Institution
    Henan Key Lab. of Photovoltaic Mater., Henan Normal Univ., Xinxiang, China
  • Volume
    1
  • fYear
    2011
  • fDate
    20-22 May 2011
  • Firstpage
    68
  • Lastpage
    72
  • Abstract
    Considering the influence of surface plasmons of the silver nano-layer, the spectrum characteristics of Si/Ag/Si nano-composite film structure are obtained and discussed. The transmittance and reflectivity of incident light at the interfaces, are analyzed as functions of the light wavelength and its incident angle. The results show that the transmittance profiles are decided by light wavelength, its incident angle and the silver nano-layer thickness. When the incidence angle θ of the light beam is 30°, 45°, 60°, respectively, and silver layer thickness d2=10nm, the reflectivity and transmittance as a function of incident light wavelength at the interface are presented. The transmittance Tr(λ) spectra are almost coincident with the solar spectrum., desired to improve the photocurrent conversion efficiency of silicon film solar cell.
  • Keywords
    elemental semiconductors; nanocomposites; photoconductivity; reflectivity; semiconductor-metal boundaries; silicon; silver; solar cells; surface plasmon resonance; thin films; Si-Ag-Si; incident light; light beam; light wavelength; nanocomposite films; photocurrent conversion efficiency; reflectivity; silicon film solar cell; silver nanolayer; solar spectrum; spectrum property; surface plasmons; transmittance profiles; Nanoparticles; Plasmons; Silicon; Silver; Solar power generation; composite structure; nano-film; solar cell; spectrum characteristics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Materials for Renewable Energy & Environment (ICMREE), 2011 International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-61284-749-8
  • Type

    conf

  • DOI
    10.1109/ICMREE.2011.5930766
  • Filename
    5930766