Title :
1/f Noise Modeling in a-Si TFTs by BSIM Software
Author :
Rhayem, J. ; Rigaud, D. ; Contaret, T. ; Valenza, M. ; Szydlo, N. ; Lebrun, H.
Author_Institution :
Universite de Montpellier II, France
fDate :
11-13 September 2000
Keywords :
Amorphous silicon; Attenuation; Fluctuations; Geometry; Insulation; Neural networks; Noise level; Solid modeling; Thin film devices; Thin film transistors;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194737
