DocumentCode :
1917510
Title :
RF analysis of aggressively scaled pHEMTs
Author :
Kalna, K. ; Roy, S. ; Asenov, A. ; Elgaid, K. ; Thayne, I.
Author_Institution :
The University of Glasgow, UK
fYear :
2000
fDate :
11-13 September 2000
Firstpage :
156
Lastpage :
159
Keywords :
Acoustic scattering; Analytical models; Electron mobility; Electron optics; III-V semiconductor materials; Monte Carlo methods; Optical scattering; PHEMTs; Phonons; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194738
Filename :
1503668
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1917510
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